The 2nd CEPHONA Workshop on Microscopic Characterisation of Materials and Structures for Photonics was held on November 22-23, 2004 at the Institute of Electron Technology in Warsaw. The program of the workshop consisted of lectures and practical training. The workshop was an opportunity for over 60 young scientists and technologists from research institutes and universities to listen to the lectures on fundamental topics of microscopic characterisation of materials and structures applied in photonics. The one fourth of participants took part in practical training on TEM specimen preparation for transmission electron microscopy (TEM) and practical issues of scanning electron microscopy (SEM).

Below you can find a list of lectures given at the workshop. By clicking the topic you can see a contribution cased on the lecture.

P. Dlu¿ewski (Institute of Physics, PAS, Warsaw, Poland)
The principles of transmission electron microscopy image formation

B. Grandidier (IEMN/CNRS, Lille, France)
Electronic and structural properties of III-V heterostructures characterized by scanning tunneling microscopy and spectroscopy

H. Kirmse (Humboldt-Universität,Berlin, Germany)
Structural and analytical characterization of semiconductor quantum dots by TEM

G. Salviati (IMEM-CNR,Parma, Italy)
Cathodoluminescence investigations of optoelectronic heterostructures and devices

M. Henini (University of Nottingham, UK)
Self-Organised Quantum Dots for Advanced Applications in Optoelectronics

J. Tomm (Max-Born-Institut, Berlin, Germany)
Application of Raman-Spectroscopy to Analytical Purposes at Semiconductor Structures and Devices

P.O. Holtz (Linkoping University, Sweden)
Micro-luminescence characterization of quantum dots

J. Piotrowski (VIGO SYSTEM S.A., Warsaw, Poland)
Recent progress in detection of long wavelength infrared radiation with advanced heterostructural phototodetectors

J. Muszalski (Institute of Electron Technology, Warsaw, Poland)
Resonant cavity enhanced photodetectors

Workshop Chairman: Jerzy K¡TCKI