electron techology
AboutThisJournal Volumes
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Vol. 36 (2004)
Table of Content
36-1
B. DZIURDZIA, Z. MAGONSKI, S. NOWAK, M. CIEZ, W. GREGORCZYK, W. NIEMYJSKI
Photoimageable thick-film microwave structures up to 18 GHz
abstract/PDF file
36-2
J. SZCZESNY, J. F. KOLODZIEJSKI, D. OBREBSKI
Electromagnetic emission of digital circuits implemented in Xilinx FPGAs
XC 4025E and XCV 800
abstract/PDF file
36-3
M. SHIOJIRI
HAADF-STEM imaging and microscopy observations of heterostructures in
electronic devices
abstract/PDF file
36-4
K. KOSIEL, K. REGINSKI, A. SZERLING, T. PIWONSKI, M. BUGAJSKI
The influence of MBE growth conditions on optical properties of
InAlGaAs/AlGaAs structures
abstract/PDF file
36-5
K. PISKORSKI, H.M. PRZEWLOCKI
Distrubition of potential barrier height local values at Al-SiO2 and Si-SiO2
interfaces of the metal-oxide-semiconductor (MOS) structures
abstract/PDF file
36-6
A. SZERLING, K. KOSIEL, M. PŁUSKA, T.J. OCHALSKI, J. RATAJCZAK
Oval defects in crystals grown by MBE technique: study and methods of elimination
abstract/PDF file

The Electron Technology - Internet Journal which is continuation of printed "Electron Technology" launched its activity in January 2002.
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